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Patrick E. Hopkins
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Chemically Exfoliated MoS2 as Near‐Infrared Photothermal Agents
SS Chou, B Kaehr, J Kim, BM Foley, M De, PE Hopkins, J Huang, ...
Angewandte Chemie International Edition 52 (15), 4160-4164, 2013
7452013
Phase stability and mechanical properties of novel high entropy transition metal carbides
TJ Harrington, J Gild, P Sarker, C Toher, CM Rost, OF Dippo, C McElfresh, ...
Acta Materialia 166, 271-280, 2019
5862019
Crossover from incoherent to coherent phonon scattering in epitaxial oxide superlattices
J Ravichandran, AK Yadav, R Cheaito, PB Rossen, A Soukiassian, ...
Nature materials 13 (2), 168-172, 2014
5442014
High-entropy fluorite oxides
J Gild, M Samiee, JL Braun, T Harrington, H Vega, PE Hopkins, K Vecchio, ...
Journal of the European Ceramic Society 38 (10), 3578-3584, 2018
5212018
Reduction in the thermal conductivity of single crystalline silicon by phononic crystal patterning
PE Hopkins, CM Reinke, MF Su, RH Olsson III, EA Shaner, ZC Leseman, ...
Nano letters 11 (1), 107-112, 2011
5022011
Charge‐induced disorder controls the thermal conductivity of entropy‐stabilized oxides
JL Braun, CM Rost, M Lim, A Giri, DH Olson, GN Kotsonis, G Stan, ...
Advanced materials 30 (51), 1805004, 2018
4172018
A high-entropy silicide:(Mo0. 2Nb0. 2Ta0. 2Ti0. 2W0. 2) Si2
J Gild, J Braun, K Kaufmann, E Marin, T Harrington, P Hopkins, K Vecchio, ...
Journal of Materiomics 5 (3), 337-343, 2019
3322019
Manipulating thermal conductance at metal–graphene contacts via chemical functionalization
PE Hopkins, M Baraket, EV Barnat, TE Beechem, SP Kearney, JC Duda, ...
Nano letters 12 (2), 590-595, 2012
3152012
Thermal Transport across Solid Interfaces with Nanoscale Imperfections: Effects of Roughness, Disorder, Dislocations, and Bonding on Thermal Boundary Conductance/ISRN Mech
PE Hopkins
Eng, 2013
3132013
Dysprosium-doped cadmium oxide as a gateway material for mid-infrared plasmonics
E Sachet, CT Shelton, JS Harris, BE Gaddy, DL Irving, S Curtarolo, ...
Nature materials 14 (4), 414-420, 2015
2812015
Thin film thermoelectric metal–organic framework with high Seebeck coefficient and low thermal conductivity
KJ Erickson, F Léonard, V Stavila, ME Foster, CD Spataru, RE Jones, ...
Advanced Materials 27 (22), 3453-3459, 2015
2802015
A review of experimental and computational advances in thermal boundary conductance and nanoscale thermal transport across solid interfaces
A Giri, PE Hopkins
Advanced Functional Materials 30 (8), 1903857, 2020
2582020
Effects of surface roughness and oxide layer on thermal boundary conductance at aluminum/silicon interfaces
PE Hopkins, M Phinney, Leslie, JR Serrano, E Beechem, Thomas
Physical Review B 82 (8), 085307, 2010
2382010
Criteria for cross-plane dominated thermal transport in multilayer thin film systems during modulated laser heating
PE Hopkins, JR Serrano, LM Phinney, SP Kearney, TW Grasser, ...
2292010
Thermally conductive ultra-low-k dielectric layers based on two-dimensional covalent organic frameworks
AM Evans, A Giri, VK Sangwan, S Xun, M Bartnof, CG Torres-Castanedo, ...
Nature materials 20 (8), 1142-1148, 2021
2082021
Experimental Investigation of Size Effects on the Thermal Conductivity<? format?> of Silicon-Germanium Alloy Thin Films
R Cheaito, JC Duda, TE Beechem, K Hattar, JF Ihlefeld, DL Medlin, ...
Physical review letters 109 (19), 195901, 2012
1952012
Controlling the Metal to Semiconductor Transition of MoS2 and WS2 in Solution
SS Chou, YK Huang, J Kim, B Kaehr, BM Foley, P Lu, C Dykstra, ...
Journal of the American Chemical Society 137 (5), 1742-1745, 2015
1802015
Effects of electron scattering at metal-nonmetal interfaces on electron-phonon equilibration in gold films
PE Hopkins, JL Kassebaum, PM Norris
Journal of Applied Physics 105 (2), 2009
1752009
High conductivity and electron‐transfer validation in an n‐type fluoride‐anion‐doped polymer for thermoelectrics in air
X Zhao, D Madan, Y Cheng, J Zhou, H Li, SM Thon, AE Bragg, ...
Advanced Materials 29 (34), 1606928, 2017
1692017
Influence of inelastic scattering at metal-dielectric interfaces
PE Hopkins, PM Norris, RJ Stevens
1672008
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