Quantifying molecular stiffness and interaction with lateral force microscopy AJ Weymouth, T Hofmann, FJ Giessibl Science 343 (6175), 1120-1122, 2014 | 151 | 2014 |
Phantom force induced by tunneling current: a characterization on Si (111) AJ Weymouth, T Wutscher, J Welker, T Hofmann, FJ Giessibl Physical review letters 106 (22), 226801, 2011 | 92 | 2011 |
Atomically resolved graphitic surfaces in air by atomic force microscopy DS Wastl, AJ Weymouth, FJ Giessibl ACS nano 8 (5), 5233-5239, 2014 | 89 | 2014 |
Optimizing atomic resolution of force microscopy in ambient conditions DS Wastl, AJ Weymouth, FJ Giessibl Physical Review B—Condensed Matter and Materials Physics 87 (24), 245415, 2013 | 84 | 2013 |
CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces M Schneiderbauer, M Emmrich, AJ Weymouth, FJ Giessibl Physical Review Letters 112 (16), 166102, 2014 | 83 | 2014 |
Interstitial ultrasound heating applicator for MR-guided thermal therapy R Chopra, C Luginbuhl, AJ Weymouth, FS Foster, MJ Bronskill Physics in Medicine & Biology 46 (12), 3133, 2001 | 64 | 2001 |
Atomic structure affects the directional dependence of friction AJ Weymouth, D Meuer, P Mutombo, T Wutscher, M Ondracek, P Jelinek, ... Physical review letters 111 (12), 126103, 2013 | 62 | 2013 |
The influence of chemical bonding configuration on atomic identification by force spectroscopy J Welker, AJ Weymouth, FJ Giessibl ACS nano 7 (8), 7377-7382, 2013 | 42 | 2013 |
Force field analysis suggests a lowering of diffusion barriers in atomic manipulation due to presence of STM tip M Emmrich, M Schneiderbauer, F Huber, AJ Weymouth, N Okabayashi, ... Physical Review Letters 114 (14), 146101, 2015 | 39 | 2015 |
Imaging in biologically-relevant environments with AFM using stiff qPlus sensors K Pürckhauer, AJ Weymouth, K Pfeffer, L Kullmann, E Mulvihill, MP Krahn, ... Scientific reports 8 (1), 9330, 2018 | 38 | 2018 |
Intramolecular force contrast and dynamic current-distance measurements at room temperature F Huber, S Matencio, AJ Weymouth, C Ocal, E Barrena, FJ Giessibl Physical Review Letters 115 (6), 066101, 2015 | 31 | 2015 |
Atomic resolution of calcium and oxygen sublattices of calcite in ambient conditions by atomic force microscopy using qPlus sensors with sapphire tips DS Wastl, M Judmann, AJ Weymouth, FJ Giessibl ACS nano 9 (4), 3858-3865, 2015 | 27 | 2015 |
Non-contact lateral force microscopy AJ Weymouth Journal of Physics: Condensed Matter 29 (32), 323001, 2017 | 26 | 2017 |
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy H Ooe, D Kirpal, DS Wastl, AJ Weymouth, T Arai, FJ Giessibl Applied Physics Letters 109 (14), 2016 | 26 | 2016 |
Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip A Liebig, P Hapala, AJ Weymouth, FJ Giessibl Scientific reports 10 (1), 14104, 2020 | 24 | 2020 |
Localization of the phantom force induced by the tunneling current T Wutscher, AJ Weymouth, FJ Giessibl Physical Review B—Condensed Matter and Materials Physics 85 (19), 195426, 2012 | 19 | 2012 |
Lateral force microscopy reveals the energy barrier of a molecular switch AJ Weymouth, E Riegel, B Simmet, O Gretz, FJ Giessibl ACS nano 15 (2), 3264-3271, 2021 | 14 | 2021 |
High-precision atomic force microscopy with atomically-characterized tips A Liebig, A Peronio, D Meuer, AJ Weymouth, FJ Giessibl New Journal of Physics 22 (6), 063040, 2020 | 14 | 2020 |
Strumming a single chemical bond AJ Weymouth, E Riegel, O Gretz, FJ Giessibl Physical Review Letters 124 (19), 196101, 2020 | 14 | 2020 |
Analysis of airborne contamination on transition metal dichalcogenides with atomic force microscopy revealing that sulfur is the preferred chalcogen atom for devices made in … K Pürckhauer, D Kirpal, AJ Weymouth, FJ Giessibl ACS Applied Nano Materials 2 (5), 2593-2598, 2019 | 14 | 2019 |