| A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology M Maggipinto, C Masiero, A Beghi, GA Susto Procedia Manufacturing 17, 126-133, 2018 | 105 | 2018 |
| A computer vision-inspired deep learning architecture for virtual metrology modeling with 2-dimensional data M Maggipinto, M Terzi, C Masiero, A Beghi, GA Susto IEEE Transactions on Semiconductor Manufacturing 31 (3), 376-384, 2018 | 65 | 2018 |
| DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology M Maggipinto, A Beghi, S McLoone, GA Susto Journal of Process Control 84, 24-34, 2019 | 52 | 2019 |
| A deep convolutional autoencoder-based approach for anomaly detection with industrial, non-images, 2-dimensional data: A semiconductor manufacturing case study M Maggipinto, A Beghi, GA Susto IEEE Transactions on Automation Science and Engineering 19 (3), 1477-1490, 2022 | 28 | 2022 |
| Adversarial training reduces information and improves transferability M Terzi, A Achille, M Maggipinto, GA Susto AAAI, 2020, 2020 | 27 | 2020 |
| A deep learning-based approach to anomaly detection with 2-dimensional data in manufacturing M Maggipinto, A Beghi, GA Susto 2019 IEEE 17th international conference on industrial informatics (INDIN) 1 …, 2019 | 20 | 2019 |
| Deep learning for virtual metrology: Modeling with optical emission spectroscopy data M Terzi, C Masiero, A Beghi, M Maggipinto, GA Susto 2017 IEEE 3rd International Forum on Research and Technologies for Society …, 2017 | 19 | 2017 |
| Induced start dynamic sampling for wafer metrology optimization GA Susto, M Maggipinto, F Zocco, S McLoone IEEE Transactions on Automation Science and Engineering 17 (1), 418-432, 2019 | 11 | 2019 |
| Exploiting 2D coordinates as bayesian priors for deep learning defect classification of SEM images S Arena, Y Bodrov, M Carletti, N Gentner, M Maggipinto, Y Yang, A Beghi, ... IEEE Transactions on Semiconductor Manufacturing 34 (3), 436-439, 2021 | 8 | 2021 |
| Laundry fabric classification in vertical axis washing machines using data-driven soft sensors M Maggipinto, E Pesavento, F Altinier, G Zambonin, A Beghi, GA Susto Energies 12 (21), 4080, 2019 | 7 | 2019 |
| Probabilistic word embeddings in neural ir: A promising model that does not work as expected (for now) A Purpura, M Maggipinto, G Silvello, GA Susto Proceedings of the 2019 ACM SIGIR International Conference on Theory of …, 2019 | 7 | 2019 |
| What are the most informative data for virtual metrology? A use case on multi-stage processes fault prediction M Maggipinto, GA Susto, F Zocco, S McLoone 2019 IEEE 15th International Conference on Automation Science and …, 2019 | 7 | 2019 |
| Machine Learning-based laundry weight estimation for vertical axis washing machines GA Susto, M Maggipinto, G Zannon, F Altinier, E Pesavento, A Beghi 2018 European Control Conference (ECC), 3179-3184, 2018 | 7 | 2018 |
| Interpretable anomaly detection for knowledge discovery in semiconductor manufacturing M Carletti, M Maggipinto, A Beghi, GA Susto, N Gentner, Y Yang, A Kyek 2020 Winter Simulation Conference (WSC), 1875-1885, 2020 | 6 | 2020 |
| Greedy search algorithms for unsupervised variable selection: a comparative study F Zocco, M Maggipinto, GA Susto, S McLoone arXiv preprint arXiv:2103.02687, 2021 | 5 | 2021 |
| A dynamic sampling approach for cost reduction in semiconductor manufacturing GA Susto, M Maggipinto, F Zocco, S McLoone Procedia Manufacturing 17, 1031-1038, 2018 | 5 | 2018 |
| Proximal deterministic policy gradient M Maggipinto, GA Susto, P Chaudhari 2020 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2020 | 4 | 2020 |
| Lazy FSCA for unsupervised variable selection F Zocco, M Maggipinto, GA Susto, S McLoone Engineering Applications of Artificial Intelligence 124, 106624, 2023 | 3 | 2023 |
| On optimising spatial sampling plans for wafer profile reconstruction S McLoone, F Zocco, M Maggipinto, GA Susto IFAC-PapersOnLine 51 (10), 115-120, 2018 | 3 | 2018 |
| β-variational classifiers under attack M Maggipinto, M Terzi, GA Susto IFAC-PapersOnLine 53 (2), 7903-7908, 2020 | 2 | 2020 |
