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Albert RigosiNational Institute of Standards and TechnologyVerified email at nist.gov
D. B. NewellNational Institute of Standards and TechnologyVerified email at nist.gov
Yanfei YangNISTVerified email at nist.gov
Mattias KruskopfPhysikalisch-Technische Bundesanstalt (PTB)Verified email at ptb.de
Chi-Te LiangProfessor of Physics, National Taiwan UniversityVerified email at phys.ntu.edu.tw
Alireza PannaNational Institutes of Standards and TechnologyVerified email at nist.gov
Angela R. Hight WalkerNational Institute of Standards and TechnologyVerified email at nist.gov
Heather M. HillBureau of Engraving and Printing, Department of TreasuryVerified email at bep.gov
Dinesh Kumar PatelPhysikalisch-Technische Bundesanstalt (PTB), Braunschweig, GermanyVerified email at ptb.de
Shamith PayagalaElectrical Engineer, National Institute of Standards & TechnologyVerified email at nist.gov
Jiuning HuNational Institute of Standards and TechnologyVerified email at nist.gov
Hanbyul JinProcess Development Engineer, IntelVerified email at intel.com
Chiashain Chuang (莊家翔)Associate Professor and Chair of Electronic Engineering, Chung Yuan Christian UniversityVerified email at cycu.edu.tw
BIYI WU台灣大學博士班Verified email at ntu.edu.tw
Martina MarzanoResearcher, Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, ItalyVerified email at inrim.it
Mariano A. RealDepartment of Quantum Metrology, Instituto Nacional de Tecnología Industrial (INTI), ArgentinaVerified email at inti.gob.ar
David Goldhaber-GordonProfessor of Physics, Stanford UniversityVerified email at stanford.edu
Kang L. WangElectrical Engineering DepartmentVerified email at ee.ucla.edu
Chieh-Wen LiuCleveland ClinicVerified email at ccf.org
Tian ShenAppleVerified email at apple.com