chenming hu

Cited by

	All	Since 2020
Citations	89946	17089
h-index	148	59
i10-index	1016	327

3800

1900

950

2850

198719881989199019911992199319941995199619971998199920002001200220032004200520062007200820092010201120122013201420152016201720182019202020212022202320242025240 319 444 489 517 636 922 911 1014 1108 1223 1388 1471 1571 1878 2037 2226 2572 2831 3139 3245 3205 2952 3188 3249 3187 3686 3740 3510 3789 3669 3655 3390 3236 3474 3384 3135 3195 663

Public access

View all

33 articles

36 articles

available

not available

Based on funding mandates

Co-authors

Tsu-Jae King LiuUniversity of CaliforniaVerified email at eecs.berkeley.edu
Yee-Chia YeoNational University of SingaporeVerified email at nus.edu.sg
Sayeef SalahuddinTSMC Distinguished Professor of EECS, University of California, BerkeleyVerified email at berkeley.edu
Leland ChangIBMVerified email at us.ibm.com
Jeffrey Bokor Professor of electrical engineering and computer sciences, University of California, BerkeleyVerified email at eecs.berkeley.edu
Mansun ChanChair Professor, HKUSTVerified email at ust.hk
Ali M NIKNEJADUC BerkeleyVerified email at berkeley.edu
Yang-Kyu ChoiProfessor of Electrical Engineering, KAISTVerified email at ee.kaist.ac.kr
AssaderaghiSiTimeVerified email at sitime.com
Darsen LuNCKUVerified email at cal.berkeley.edu
Hideki TakeuchiAtomeraVerified email at atomera.com
Sriramkumar VenugopalanSemiconductors ProfessionalVerified email at eecs.berkeley.edu
Dennis SylvesterProfessor of Electrical Engineering and Computer Science, University of MichiganVerified email at umich.edu
Vivek SubramanianEcole polytechnique Federale de Lausanne (EPFL)Verified email at epfl.ch
Michael OrshanskyUniversity of Texas at AustinVerified email at utexas.edu
Yu CaoProfessor, University of MinnesotaVerified email at umn.edu
Pin SuNational Chiao Tung UniversityVerified email at faculty.nctu.edu.tw
Kaustav BanerjeeUC Santa Barbara, Stanford University, UC BerkeleyVerified email at ece.ucsb.edu
Hyungcheol ShinSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
Ali JaveyProfessor of Electrical Engineering and Computer Sciences, UC BerkeleyVerified email at berkeley.edu

chenming hu

University of California, Berkeley

Verified email at eecs.berkeley.edu - Homepage

engineering


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
FinFET-a self-aligned double-gate MOSFET scalable to 20 nm D Hisamoto, WC Lee, J Kedzierski, H Takeuchi, K Asano, C Kuo, ... IEEE transactions on electron devices 47 (12), 2320-2325, 2000	2439	2000
Hot-electron-induced MOSFET degradation-model, monitor, and improvement C Hu, SC Tam, FC Hsu, PK Ko, TY Chan, KW Terrill IEEE Journal of Solid-State Circuits 20 (1), 295-305, 1985	1985	1985
MoS2 transistors with 1-nanometer gate lengths SB Desai, SR Madhvapathy, AB Sachid, JP Llinas, Q Wang, GH Ahn, ... Science 354 (6308), 99-102, 2016	1587	2016
A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors KK Hung, PK Ko, C Hu, YC Cheng IEEE Transactions on Electron Devices 37 (3), 654-665, 1990	1092	1990
Modern semiconductor devices for integrated circuits C Hu (No Title), 2010	935	2010
FinFET scaling to 10 nm gate length B Yu, L Chang, S Ahmed, H Wang, S Bell, CY Yang, C Tabery, C Ho, ... Digest. International Electron Devices Meeting,, 251-254, 2002	879	2002
Sub 50-nm finfet: Pmos X Huang, WC Lee, C Kuo, D Hisamoto, L Chang, J Kedzierski, ... International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999	847	1999
Enhanced ferroelectricity in ultrathin films grown directly on silicon SS Cheema, D Kwon, N Shanker, R Dos Reis, SL Hsu, J Xiao, H Zhang, ... Nature 580 (7804), 478-482, 2020	751	2020
New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation Y Cao, T Sato, M Orshansky, D Sylvester, C Hu Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No …, 2000	725	2000
Hole injection SiO/sub 2/breakdown model for very low voltage lifetime extrapolation KF Schuegraf, C Hu IEEE transactions on electron devices 41 (5), 761-767, 1994	723	1994
Finfet transistor structures having a double gate channel extending vertically from a substrate and methods of manufacture C Hu, TJ King, V Subramanian, L Chang, X Huang, YK Choi, ... US Patent 6,413,802, 2002	690	2002
MOSFET modeling & BSIM3 user’s guide Y Cheng, C Hu Springer Science & Business Media, 2007	654	2007
MOS capacitance measurements for high-leakage thin dielectrics KJ Yang, C Hu IEEE Transactions on Electron Devices 46 (7), 1500-1501, 1999	649	1999
Dynamic threshold-voltage MOSFET (DTMOS) for ultra-low voltage VLSI F Assaderaghi, D Sinitsky, SA Parke, J Bokor, PK Ko, C Hu IEEE Transactions on Electron Devices 44 (3), 414-422, 1997	634	1997
Electrical breakdown in thin gate and tunneling oxides IC Chen, SE Holland, C Hu IEEE journal of Solid-state Circuits 20 (1), 333-342, 1985	626	1985
Sub-50 nm P-channel FinFET X Huang, WC Lee, C Kuo, D Hisamoto, L Chang, J Kedzierski, ... IEEE Transactions on Electron Devices 48 (5), 880-886, 2001	618	2001
Lucky-electron model of channel hot-electron injection in MOSFET's S Tam, PK Ko, C Hu IEEE transactions on electron devices 31 (9), 1116-1125, 1984	609	1984
Threshold voltage model for deep-submicrometer MOSFETs ZH Liu, C Hu, JH Huang, TY Chan, MC Jeng, PK Ko, YC Cheng IEEE Transactions on electron devices 40 (1), 86-95, 1993	593	1993
Metal-dielectric band alignment and its implications for metal gate complementary metal-oxide-semiconductor technology YC Yeo, TJ King, C Hu Journal of applied physics 92 (12), 7266-7271, 2002	566	2002
Frequency-independent equivalent-circuit model for on-chip spiral inductors Y Cao, RA Groves, X Huang, ND Zamdmer, JO Plouchart, RA Wachnik, ... IEEE Journal of solid-state circuits 38 (3), 419-426, 2003	539	2003

The system can't perform the operation now. Try again later.

Articles 1–20

Citations per year

Duplicate citations

Merged citations

Add co-authorsCo-authors

Follow

Cited by

Co-authors