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Hyunchul Sohn
Hyunchul Sohn
연세대학교 신소재학과 교수
Verified email at yonsei.ac.kr
Title
Cited by
Cited by
Year
Hafnium oxide and aluminium oxide alloyed dielectric layer and method for fabricating the same
DS Kil, J Roh, HC Sohn
US Patent App. 10/819,202, 2005
5122005
Highly scalable saddle-Fin (S-Fin) transistor for sub-50nm DRAM technology
SW Park, SJ Hong, JW Kim, JG Jeong, KD Yoo, SC Moon, HC Sohn, ...
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers., 32-33, 2006
3132006
Evidence for Hole-Driven Conductivity in and Thin Films
HL Ju, HC Sohn, KM Krishnan
Physical review letters 79 (17), 3230, 1997
2071997
Effects of the growth temperature and As/Ga flux ratio on the incorporation of excess As into low temperature grown GaAs
M Luysberg, H Sohn, A Prasad, P Specht, Z Liliental-Weber, ER Weber, ...
Journal of applied physics 83 (1), 561-566, 1998
1651998
Magnetic inhomogeneity and colossal magnetoresistance in manganese oxides
HL Ju, H Sohn
Journal of magnetism and magnetic materials 167 (3), 200-208, 1997
1621997
Adsorptive desulfurization and denitrogenation of refinery fuels using mesoporous silica adsorbents
JM Kwon, JH Moon, YS Bae, DG Lee, HC Sohn, CH Lee
ChemSusChem: Chemistry & Sustainability Energy & Materials 1 (4), 307-309, 2008
1292008
Role of grain boundaries in double exchange manganite oxides La1− xAxMnO3 (A= Ba, Ca)
HL Ju, H Sohn
Solid state communications 102 (6), 463-466, 1997
1261997
J Vac Sci Technol
H Kim
B 21, 2231, 2003
1172003
Electron microscopy characterization of GaN films grown by molecular‐beam epitaxy on sapphire and SiC
Z Liliental‐Weber, H Sohn, N Newman, J Washburn
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995
1061995
Ga vacancies in low-temperature-grown GaAs identified by slow positrons
J Gebauer, R Krause-Rehberg, S Eichler, M Luysberg, H Sohn, ER Weber
Applied physics letters 71 (5), 638-640, 1997
1011997
Development of new TiN/ZrO2/Al2O3/ZrO2/TiN capacitors extendable to 45nm generation DRAMs replacing HfO2 based dielectrics
DS Kil, HS Song, KJ Lee, K Hong, JH Kim, KS Park, SJ Yeom, JS Roh, ...
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers., 38-39, 2006
962006
Low temperature atomic layer deposition of ruthenium thin films using isopropylmethylbenzene-cyclohexadiene-ruthenium and O2
TK Eom, W Sari, KJ Choi, WC Shin, JH Kim, DJ Lee, KB Kim, H Sohn, ...
Electrochemical and Solid-State Letters 12 (11), D85, 2009
862009
The electronic structure of C60/ZnPc interface for organic photovoltaic device with blended layer architecture
SH Park, JG Jeong, HJ Kim, SH Park, MH Cho, SW Cho, Y Yi, MY Heo, ...
Applied Physics Letters 96 (1), 2010
742010
TEM study on volume changes and void formation in Ge2Sb2Te5 films, with repeated phase changes
K Do, D Lee, DH Ko, H Sohn, MH Cho
Electrochemical and Solid-State Letters 13 (8), H284, 2010
732010
Phase‐change memory in Bi2Te3 nanowires
N Han, SI Kim, JD Yang, K Lee, H Sohn, HM So, CW Ahn, KH Yoo
Advanced Materials 23 (16), 1871, 2011
682011
Phase change behavior in oxygen-incorporated Ge2Sb2Te5 films
MH Jang, SJ Park, DH Lim, MH Cho, KH Do, DH Ko, HC Sohn
Applied physics letters 95 (1), 2009
632009
Effects of B2H6 pretreatment on ALD of W film using a sequential supply of WF6 and SiH4
SH Kim, ES Hwang, BM Kim, JW Lee, HJ Sun, TE Hong, JK Kim, H Sohn, ...
Electrochemical and Solid-State Letters 8 (10), C155, 2005
482005
High current fast switching n-ZnO/p-Si diode
Y Choi, K Lee, CH Park, KH Lee, JW Nam, MM Sung, KM Lee, HC Sohn, ...
Journal of Physics D: Applied Physics 43 (34), 345101, 2010
452010
A comparative study of the atomic-layer-deposited tungsten thin films as nucleation layers for W-plug deposition
SH Kim, N Kwak, J Kim, H Sohn
Journal of the Electrochemical Society 153 (10), G887, 2006
442006
A bilayer diffusion barrier of ALD-Ru/ALD-TaCN for direct plating of Cu
SH Kim, HT Kim, SS Yim, DJ Lee, KS Kim, HM Kim, KB Kim, H Sohn
Journal of The Electrochemical Society 155 (8), H589, 2008
362008
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