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Co-authors
- Heon-Jin ChoiDepartment of Materials Science and Engineering, Yonsei UniversityVerified email at yonsei.ac.kr
- Young Duck KimAssociate Professor, Department of Physics, Kyung Hee University, Seoul 02447, Republic of KoreaVerified email at khu.ac.kr
- James C. HoneDepartment of Mechanical Engineering, Columbia UniversityVerified email at columbia.edu
- T.TaniguchiNational Institute for Materials ScienceVerified email at nims.go.jp
- En-Min ShihColumbia UniversityVerified email at columbia.edu
- Cory R. DeanColumbia UnviersityVerified email at phys.columbia.edu
- Sang Hoon ChaeNanyang Assistant Professor, Nanyang Technological UniversityVerified email at ntu.edu.sg
- Tony LowU of Minnesota, IBM Research, Columbia U, Purdue U, National U SingaporeVerified email at us.ibm.com
- Tony F HeinzDepts. of Applied Physics, Photon Science, and, by courtesy, of Electrical Eng., SLAC, StanfordVerified email at stanford.edu
- Jun YinNanjing University of Aeronautics and AstronauticsVerified email at nuaa.edu.cn
- Jungwon KimKorea Institute of Science and TechnologyVerified email at kist.re.kr
- Yuanda GaoIntel Corporation, Columbia UniversityVerified email at columbia.edu
- Xu CuiAutoX